XPS, FTIR-ATR, and AFM structural study of silicon-grafted triol monolayers for controlled anchoring of single molecule magnets

Journal of Physical Chemistry C

Volumn 114, Issue 48, 2010, Pages 20696-20701

  Motta, Alessandro ^a   Condorelli, Guglielmo G ^a   Pellegrino, Giovanna ^a   Cornia, Andrea ^b   Fragalà, Ignazio L ^a  

^a UNIVERSITY OF CATANIA   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

1-ALKENES; AFM; AGING EFFECTS; ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY; ATTENUATED TOTAL REFLECTIONS; DEPROTECTION; END GROUPS; FORCE LITHOGRAPHY; FT-IR-ATR; FTIR; HYDROSILYLATION REACTION; MOLE FRACTION; MOLECULAR RECEPTORS; MONOLAYER STRUCTURES; OH GROUP; RECOVERY PROCESS; SI SURFACES; SI(1 0 0); SINGLE-MOLECULE MAGNET; STERIC HINDRANCES; STRUCTURAL STUDIES; SURFACE CONCENTRATION; XPS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ELECTRON ENERGY LEVELS; HYDROSILYLATION; LIGANDS; MAGNETS; METHANOL; MONOLAYERS; OLEFINS; PROPANE; SEMICONDUCTING SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTAL ATOMIC STRUCTURE;

EID: 78650097663     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp106081t     Document Type: Article

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