Magnetic resonance electrical impedance tomography (MREIT)

SIAM Review

Volumn 53, Issue 1, 2011, Pages 40-68

  Seo, Jin Keun ^a   Woo, Eung Je ^b  

^a Yonsei University   (South Korea)

^b Kyung Hee University   (South Korea)

Author keywords

Electrical impedance tomography; Inverse problems; Magnetic resonance EIT

Indexed keywords

CONDUCTING OBJECTS; CONDUCTIVITY DISTRIBUTIONS; CONDUCTIVITY IMAGE; DATA SETS; ELECTRICAL IMPEDANCE TOMOGRAPHY; EQUIPOTENTIAL CURVES; FORWARD MODELING; HARMONIC B; HIGH RESOLUTION; ILL POSED; ILL-POSEDNESS; IMAGING MODALITY; IN-VIVO; INJECTED CURRENT; LAPLACIANS; MAGNETIC FLUX DENSITIES; MAGNETIC RESONANCE ELECTRICAL IMPEDANCE TOMOGRAPHIES; MAGNETIZATION DIRECTION; MATHEMATICAL FRAMEWORKS; MRI SCANNERS; NOVEL ALGORITHM; NUMERICAL SIMULATION; RECONSTRUCTION PROBLEMS; ROBUST RECONSTRUCTION; STATIC CONDUCTIVITY; VECTOR FIELDS;

ALGORITHMS; DIAGNOSTIC RADIOGRAPHY; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; EXPERIMENTS; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; INVERSE PROBLEMS; MAGNETIC FLUX; MAGNETIC RESONANCE; MAGNETIC STRUCTURE; SCANNING;

ELECTRIC IMPEDANCE;

EID: 78650039779     PISSN: 00361445     EISSN: None     Source Type: Journal    
DOI: 10.1137/080742932     Document Type: Review

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