Meyer-Neldel rule for charge carrier transport in fullerene devices: A comparative study

Organic Electronics

Volumn 12, Issue 1, 2011, Pages 161-168

  Pivrikas, A ^a   Ullah, Mujeeb ^a   Singh, Th B ^a   Simbrunner, C ^a   Matt, G ^a   Sitter, H ^a   Sariciftci, N S ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Arrhenius; Carrier mobility; CELIV; Charge transport; Meyer Neldel rule; OFET

Indexed keywords

ACTIVATION ENERGY; CARRIER CONCENTRATION; CARRIER MOBILITY; CHARGE TRANSFER; ELECTRON MOBILITY; ELECTRON TRANSPORT PROPERTIES; FULLERENES; HOLE MOBILITY; INTERFACES (MATERIALS); ORGANIC FIELD EFFECT TRANSISTORS; PHYSICAL VAPOR DEPOSITION;

ARRHENIUS; CELIV; CONCENTRATION DEPENDENCE; CONCENTRATION-DEPENDENT; MEYER-NELDEL RULES; PHYSICAL VAPOUR DEPOSITION; TEMPERATURE DEPENDENT; TRANSISTOR CHANNELS;

CARRIER TRANSPORT;

EID: 78649347745     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2010.10.014     Document Type: Article

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