Charge carrier mobility in regioregular poly(3-hexylthiophene) probed by transient conductivity techniques: A comparative study

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 3, 2005, Pages

  Mozer, Attila J ^a   Sariciftci, Niyazi Serdar ^a   Pivrikas, Almantas ^b   Österbacka, Ronald ^b   Juška, Gytis ^c   Brassat, Lutz ^d   Bässler, Heinz ^e  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b ÅBO AKADEMI UNIVERSITY   (Finland)

^c VILNIUS UNIVERSITY   (Lithuania)

^d H C Starch GmbH   (Germany)

^e PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

POLY(3 HEXYLTHIOPHENE); THIOPHENE DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CONDUCTANCE; DIELECTRIC CONSTANT; ELECTRIC FIELD; SEMICONDUCTOR; THERMAL CONDUCTIVITY; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 15544383554     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.035214     Document Type: Article

References (37)

1. P. M. Borsenberger and D. S. Weiss, Organic Photoreceptors for Xerography (Marcel Dekker, Inc., New York, 1998).
2. H. Scher and E. W. M̀ontroll, Phys. Rev. B 12, 2455 (1975).
3. D. Hertel, H. Bässler, U. Scherf, and H. H. Hörhold, J. Chem. Phys. 110, 9214 (1999).
4. H. Bässler, Phys. Status Solidi B 175, 15 (1993).
5. P. M. Borsenberger and J. J. Fitzgerald, J. Phys. Chem. 97, 4815 (1993).
6. Y. Shirota, J. Mater. Chem. 10, 1 (2000).
7. H. C. F. Martens, P. W. M. Blom, and H. F. M. Schoo, Phys. Rev. B 61, 7489 (2000); A. J. Mozer, P. Denk, M. C. Scharber, H. Neugebauer, N. S. Sariciftci, P. Wagner, L. Lutsen, and D. Vanderzande, J. Phys. Chem. B 108, 5235 (2004).
8. H. C. F. Martens, P. W. M. Blom, and H. F. M. Schoo, Phys. Rev. B 61, 7489 (2000); A. J. Mozer, P. Denk, M. C. Scharber, H. Neugebauer, N. S. Sariciftci, P. Wagner, L. Lutsen, and D. Vanderzande, J. Phys. Chem. B 108, 5235 (2004).
9. C. Im, H. Bässler, H. Rost, and H. H. Hörhold, J. Chem. Phys. 113, 3802 (2000); P. M. Borsenberger, L. T. Pautmeier, and H. Bässler, Phys. Rev. B 46, 12 145 (1992).
10. C. Im, H. Bässler, H. Rost, and H. H. Hörhold, J. Chem. Phys. 113, 3802 (2000); P. M. Borsenberger, L. T. Pautmeier, and H. Bässler, Phys. Rev. B 46, 12 145 (1992).
11. P. M. Borsenberger, R. Richert, and H. Bässler, Phys. Rev. B 47, 4289 (1993).
12. V. I. Arkhipov, P. Heremans, E. V. Emelianova, G. J. Adriaenssens, and H. Bässler, J. Phys.: Condens. Matter 14, 9899 (2002).
13. G. Juška, K. Arlauskas, M. Viliunas, and J. Kočka, Phys. Rev. Lett. 84, 4946 (2000).
14. G. Juška, N. Nekrasas, K. Genevičius, J. Stuchlik, and J. Kočka, Thin Solid Films 451-452, 290 (2004).
15. G. Juška, K. Arlauskas, M. Viliunas, K. Genevičius, R. Österbacka, and H. Stubb, Phys. Rev. B 62, R16 235 (2000).
16. Z. Bao, A. Dodabalapur, and A. J. Lovinger, Appl. Phys. Lett. 69, 4108 (1996); M. S. A. Abdou, F. P. Orfino, Z. W. Xie, M. J. Deen, and S. Holdcroft, Adv. Mater. (Weinheim, Ger.) 6, 838 (1994).
17. Z. Bao, A. Dodabalapur, and A. J. Lovinger, Appl. Phys. Lett. 69, 4108 (1996); M. S. A. Abdou, F. P. Orfino, Z. W. Xie, M. J. Deen, and S. Holdcroft, Adv. Mater. (Weinheim, Ger.) 6, 838 (1994).
18. S. Hoshino, M. Yoshida, S. Uemura, T. Kodzasa, N. Takada, T. Kamata, and K. Yase, J. Appl. Phys. 95, 5088 (2004).
19. A. J. Mozer and N. S. Sariciftci, Chem. Phys. Lett. 389, 438 (2004).
20. P. M. Borsenberger, J. Appl. Phys. 68, 5682 (1990).
21. G. Juška, K. Genevičius, K. Arlauskas, R. Österbacka, and H. Stubb, Phys. Rev. B 65, 233208 (2002).
22. H. Cordes, S. D. Baranovskii, K. Kohary, P. Thomas, S. Yamasaki, F. Hensel, and J.-H. Wendorff, Phys. Rev. B 63, 094201 (2001); A. Hirao, H. Nishizawa, and M. Sugiuchi, Phys. Rev. Lett. 75, 1787 (1995).
23. H. Cordes, S. D. Baranovskii, K. Kohary, P. Thomas, S. Yamasaki, F. Hensel, and J.-H. Wendorff, Phys. Rev. B 63, 094201 (2001); A. Hirao, H. Nishizawa, and M. Sugiuchi, Phys. Rev. Lett. 75, 1787 (1995).
24. M. M. Erwin, J. McBride, A. V. Kadavanich, and S. J. Rosenthal, Thin Solid Films 409, 198 (2002).
25. A. Peled and L. B. Schein, Chem. Phys. Lett. 153, 422 (1988); M. Novo, M. van der Auweraer, F. C. DeSchyver, P. M. Borsenberger, and H. Bässler, Phys. Status Solidi B 177, 223 (1993).
26. A. Peled and L. B. Schein, Chem. Phys. Lett. 153, 422 (1988); M. Novo, M. van der Auweraer, F. C. DeSchyver, P. M. Borsenberger, and H. Bässler, Phys. Status Solidi B 177, 223 (1993).
27. I. I. Fishchuk, A. Kadashchuk, H. Bässler, and M. Abkowitz, Phys. Rev. B 70, 245212 (2004).
28. H. Scher, M. F. Shlesinger, and J. T. Bendler, Phys. Today 44, 26 (1991).
29. V. I. Akhipov and A. I. Rudenko, Philos. Mag. B 45, 18 (1982).
30. P. M. Borsenberger, L. T. Pautmeier, and H. Bässler, Phys. Rev. B 46, 12 145 (1992).
31. G. Juška, N. Nekrasas, K. Arlauskas, J. Stuchlik, A. Fejfar, and J. Kočka, J. Non-Cryst. Solids 338-340, 353 (2004).
32. S. S. Pandey, W. Takashima, S. Nagamatsu, T. Endo, M. Rikukawa, and K. Kaneto, Jpn. J. Appl. Phys., Part 2 39, L94 (2000).
33. R. A. Marcus, Rev. Mod. Phys. 65, 599 (1993).
34. B. Hartenstein, H. Bässler, S. Heun, P. Borsenberger, M. van der Auweraer, and F. C. DeSchryver, Chem. Phys. 191, 321 (1995).
35. L. Pautmeier, R. Richert, and H. Bässler, Philos. Mag. Lett. 59, 325 (1989).
36. H. C. F. Martens, H. B. Brom, and P. W. M. Blom, Phys. Rev. B 60, R8489 (1999).
37. P. W. M. Blom and M. C. J. M. Vissenberg, Phys. Rev. Lett. 80, 3819 (1998).