Contact degradation in hot/cold operation of direct contact micro-switches

Journal of Micromechanics and Microengineering

Volumn 20, Issue 10, 2010, Pages

  Yang, Z ^a   Lichtenwalner, D ^a   Morris, A ^b   Krim, J ^a   Kingon, A I ^c  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b Wispry   (United States)

^c BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONTACT DEGRADATION; CONTACT FORCES; DIRECT CONTACT; FIELD EVAPORATION; GOLD ATOMS; GOLD CONTACTS; MATERIAL TRANSFERS; MICRO CONTACT; MICROSWITCHES; OPERATION CONDITIONS; SURFACE CONTAMINATIONS; SWITCHING OPERATIONS; TRANSIENT HEAT;

DEGRADATION; ELECTRIC SWITCHES; GOLD; HEAT RESISTANCE; SURFACE ROUGHNESS;

SWITCHING;

EID: 78049363155     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/20/10/105028     Document Type: Article

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