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Volumn 16, Issue 8, 2005, Pages 1083-1088
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Controlled deposition of gold nanodots using non-contact atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEPOSITION;
ELECTRIC FIELDS;
ELECTRIC POTENTIAL;
FEEDBACK CONTROL;
IONS;
LITHOGRAPHY;
MORPHOLOGY;
NANOTECHNOLOGY;
SCANNING ELECTRON MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
GOLD NANODOTS;
OSCILLATING CANTILEVER;
SCANNING PROBE MICROSCOPY (SPM);
TIP-SUBSTRATES;
GOLD;
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EID: 21144455589
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/16/8/015 Document Type: Article |
Times cited : (18)
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References (16)
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