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Volumn 51-52, Issue , 1996, Pages 541-546

Relations between texture and electrical parameters of thin polycrystalline zinc oxide films

Author keywords

Electrical Conductivity; Texture; Transparent Conductive Oxide Films; X Ray Diffraction

Indexed keywords


EID: 17544378451     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.51-52.541     Document Type: Article
Times cited : (31)

References (8)
  • 5
    • 84902964228 scopus 로고
    • ed. by H.P. Strunk, J. Werner, B. Fortin and O. Bonaud Scitec Publ., Switzerland
    • K. Ellmer and R. Mientus: In Proc. Polycrystalline Semiconductors III, ed. by H.P. Strunk, J. Werner, B. Fortin and O. Bonaud (Scitec Publ., Switzerland, 1994), p. 433.
    • (1994) Proc. Polycrystalline Semiconductors III , pp. 433
    • Ellmer, K.1    Mientus, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.