Multiple fault diagnosis in crossbar nano-architectures

2010 15th IEEE European Test Symposium, ETS'10

Volumn , Issue , 2010, Pages 94-99

  Farazmand, Navid ^a   Tahoori, Mehdi B ^a,b  

^a Northeastern University   (United States)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AREA OVERHEAD; CROSSBAR ARCHITECTURE; DOWN-SCALING; DUAL RAIL; ERROR-CHECKING; FAULT TOLERANCE TECHNIQUES; LITHOGRAPHIC FABRICATION; MULTIPLE FAULT DIAGNOSIS; MULTIPLE FAULTS; NANOARCHITECTURES; PERMANENT FAULTS; SELF REPAIR; TRANSIENT FAULTS;

FAULT DETECTION; QUALITY ASSURANCE;

FAULT TOLERANCE;

EID: 78049301259     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETSYM.2010.5512774     Document Type: Conference Paper

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