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Volumn 108, Issue 7, 2010, Pages

High capacitance density by CaCu3Ti4O12 thin films

Author keywords

[No Author keywords available]

Indexed keywords

BRICK WALL; ELECTRODE POLARIZATIONS; HIGH RELIABILITY; HIGH-CAPACITANCE DENSITY; INTERNAL BARRIERS; METAL CAPACITORS; METAL-OXIDE; METALORGANIC CHEMICAL VAPOR DEPOSITION; REPRODUCIBILITIES; ROOM TEMPERATURE;

EID: 77958188200     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3488893     Document Type: Article
Times cited : (22)

References (29)
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    • Colossal dielectric constants in single-crystalline and ceramic CaCu3 Ti4 O12 investigated by broadband dielectric spectroscopy
    • DOI 10.1063/1.2902374
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  • 20
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    • DOI 10.1063/1.2207991
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  • 22
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    • 12 thin film capacitors
    • DOI 10.1063/1.2814043
    • G. Deng, T. Yamada, and P. Muralt, Appl. Phys. Lett. APPLAB 0003-6951 91, 202903 (2007). 10.1063/1.2814043 (Pubitemid 350128926)
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    • Deng, G.1    Yamada, T.2    Muralt, P.3
  • 24
    • 34547214262 scopus 로고    scopus 로고
    • Broadband dielectric spectroscopy on single-crystalline and ceramic Ca Cu3 Ti4 O12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.