Embedded silicon nanocrystals studied by photoluminescence and Raman spectroscopies: Exciton and phonon confinement effects

Journal of Physical Chemistry C

Volumn 114, Issue 41, 2010, Pages 17344-17349

  Miska, Patrice ^a   Dossot, Manuel ^b   Nguyen, Thi D ^a,b   Grün, Matthias ^a   Rinnert, Hervé ^a   Vergnat, Michel ^a   Humbert, Bernard ^c  

^a INSTITUT JEAN LAMOUR   (France)

^b Laboratoire de Chimie Physique et Microbiologie pour l'Environnement   (France)

^c UNIVERSITÉ DE NANTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATION; EXCITONS; NANOCRYSTALS; PHONONS; SILICA; SILICON;

EMBEDDED NANOCRYSTALS; MULTI-LAYERED; PHONON CONFINEMENT EFFECT; PHONON CONFINEMENT MODEL; PHOTOLUMINESCENCE AND RAMAN SPECTROSCOPY; SILICA MATRIX; SILICON NANOCRYSTALS; VIBRATIONAL PROPERTIES;

SILICON OXIDES;

EID: 77957993103     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp1044095     Document Type: Article

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