메뉴 건너뛰기




Volumn , Issue , 2010, Pages 1250-1253

Effect of surface conduction on dielectric charging in RF MEMS capacitive switches

Author keywords

Charge injection; Conductivity; Dielectric films; Dielectric materials; Humidity; Humidity sensor; Microelectromechanical devices; Microwave devices; Switches

Indexed keywords

AMBIENT HUMIDITY; CONDUCTIVITY; DIELECTRIC CHARGING; ENHANCED SURFACE; HUMIDITY; MICRO-ELECTRO-MECHANICAL; RF MEMS CAPACITIVE SWITCHES; SURFACE CHARGING; SURFACE CONDUCTION; SURFACE CONDUCTIVITY;

EID: 77957772073     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2010.5515661     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 2
    • 67650441911 scopus 로고    scopus 로고
    • Review of device and reliability physics of dielectrics in electrostatically driven MEMS devices
    • June.
    • W. A. de Groot, J. R. Webster, D. Felnhofer, and E. P. Gusev, "Review of device and reliability physics of dielectrics in electrostatically driven MEMS devices," IEEE Trans. Device Materials Reliability, vol.9, pp. 190-202, June. 2009.
    • (2009) IEEE Trans. Device Materials Reliability , vol.9 , pp. 190-202
    • De Groot, W.A.1    Webster, J.R.2    Felnhofer, D.3    Gusev, E.P.4
  • 6
    • 1542273417 scopus 로고    scopus 로고
    • Surface conductivity of a CMOS silicon nitride layer
    • Oct.
    • P. Ruther, K. Colelli, H.-P. Frerichs, and O. Paul, "Surface conductivity of a CMOS silicon nitride layer," in Proc. IEEE Sensors, vol.2, pp. 920-925, Oct. 2003.
    • (2003) Proc. IEEE Sensors , vol.2 , pp. 920-925
    • Ruther, P.1    Colelli, K.2    Frerichs, H.-P.3    Paul, O.4
  • 7
    • 51549118092 scopus 로고    scopus 로고
    • Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches
    • Apr.
    • R. W. Herfst, P. G. Steeneken, J. Schmitz, A. J. G. Mank and M. Gils, "Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches," in IEEE Int. Reliability Physics Symp. Dig., Apr. 2008, pp 492-495.
    • (2008) IEEE Int. Reliability Physics Symp. Dig. , pp. 492-495
    • Herfst, R.W.1    Steeneken, P.G.2    Schmitz, J.3    Mank, A.J.G.4    Gils, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.