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R. W. Herfst, P. G. Steeneken, J. Schmitz, A. J. G. Mank and M. Gils, "Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches," in IEEE Int. Reliability Physics Symp. Dig., Apr. 2008, pp 492-495.
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Z. Peng, C. Palego, J. C. M. Hwang, C. Moody, A. Malczewski, B. W. Pillans, D. I. Forehand, and C. L. Goldsmith, "Effect of packaging on dielectric charging in RF MEMS capacitive switches," in IEEE MTT-S Int. Microwave Symp. Dig., June 2009,pp. 1637-1640.
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