SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 108, Issue 6, 2010, Pages

Conductive path formation in glasses of phase change memory

(4) Simon, M a Nardone, M a Karpov, V G a Karpov, I V b

a UNIVERSITY OF TOLEDO (United States)

b INTEL CORPORATION (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE MEDIUM; ANALYTICAL APPROACH; CHALCOGENIDE GLASS; CLOSED-FORM EXPRESSION; CONDUCTIVE PATHS; CRITICAL VOLUME; CRYSTALLINE VOLUME FRACTION; DATA RETENTION; DEVICE FAILURES; DEVICE GEOMETRIES; DEVICE PARAMETERS; DEVICE RELIABILITY; EXTERNAL FIELDS; FAILURE MECHANISM; FAILURE PROBABILITY; HALF-SPACE; PATH FORMATION; PERCOLATION CLUSTERS; PERCOLATION THEORY; PROBABILITY AND STATISTICS; RANDOM WALK; THIN LAYERS;

COMPUTER SIMULATION; CRYSTALLINE MATERIALS; GLASS; SOLVENTS; TITRATION;

PHASE CHANGE MEMORY;

EID: 77957735144 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3478713 Document Type: Article

Times cited : (21)

References (22)

1
- 77952417289
- TDIMD5 0163-1918, 10.1109/IEDM.2009.5424415
- R. Bez, Tech. Dig.-Int. Electron Devices Meet. TDIMD5 0163-1918 2009, 89 10.1109/IEDM.2009.5424415.
- Tech. Dig. - Int. Electron Devices Meet. , vol.2009 , pp. 89
- Bez, R.¹

2
- 77952357088
- TDIMD5 0163-1918, 10.1109/IEDM.2009.5424263
- D. Kau, S. Tang, I. V. Karpov, R. Dodge, B. Klehn, J. A. Kalb, J. Strand, A. Diaz, N. Leung, J. Wu, S. Lee, T. Langtry, K. W. Chang, C. Papagianni, J. Lee, J. Hirst, S. Erra, E. Flores, N. Righos, H. Castro, and G. Spadini, Tech. Dig.-Int. Electron Devices Meet. TDIMD5 0163-1918, 2009, 617 10.1109/IEDM.2009.5424263.
- Tech. Dig. - Int. Electron Devices Meet. , vol.2009 , pp. 617
- Kau, D.¹ Tang, S.² Karpov, I.V.³ Dodge, R.⁴ Klehn, B.⁵ Kalb, J.A.⁶ Strand, J.⁷ Diaz, A.⁸ Leung, N.⁹ Wu, J.¹⁰ Lee, S.¹¹ Langtry, T.¹² Chang, K.W.¹³ Papagianni, C.¹⁴ Lee, J.¹⁵ Hirst, J.¹⁶ Erra, S.¹⁷ Flores, E.¹⁸ Righos, N.¹⁹ Castro, H.²⁰ Spadini, G.²¹ more..

3
- 25844479330
- Dielectric breakdown mechanisms in gate oxides
- DOI 10.1063/1.2147714, 121301
- S. Lombardo, J. H. Stathis, B. P. Linder, K. L. Pey, F. Palumbo, and C. H. Tung, J. Appl. Phys. JAPIAU 0021-8979 98, 121301 (2005). 10.1063/1.2147714 (Pubitemid 43032083)
- (2005) Journal of Applied Physics , vol.98 , Issue.12 , pp. 1-36
- Lombardo, S.¹ Stathis, J.H.² Linder, B.P.³ Pey, K.L.⁴ Palumbo, F.⁵ Tung, C.H.⁶

4
- 0000041835
- JAPIAU 0021-8979. 10.1063/1.371590
- J. H. Stathis, J. Appl. Phys. JAPIAU 0021-8979 86, 5757 (1999). 10.1063/1.371590
- (1999) J. Appl. Phys. , vol.86 , pp. 5757
- Stathis, J.H.¹

5
- 33747189832
- Stability study of CdS/CdTe solar cells made with Ag and Ni back-contacts
- DOI 10.1016/j.solmat.2006.05.007, PII S0927024806002005
- S. H. Demtsu, D. S. Albin, J. W. Pankow, and A. Davies, Sol. Energy Mater. Sol. Cells SEMCEQ 0927-0248 90, 2934 (2006). 10.1016/j.solmat.2006.05.007 (Pubitemid 44233229)
- (2006) Solar Energy Materials and Solar Cells , vol.90 , Issue.17 , pp. 2934-2943
- Demtsu, S.H.¹ Albin, D.S.² Pankow, J.W.³ Davies, A.⁴

6
- 20444493159
- Nonlinear shunt paths in thin-film CdTe solar cells
- DOI 10.1063/1.1856216, 054503
- T. J. McMahon, T. J. Berniard, and D. S. Albin, J. Appl. Phys. JAPIAU 0021-8979 97, 054503 (2005). 10.1063/1.1856216 (Pubitemid 40818264)
- (2005) Journal of Applied Physics , vol.97 , Issue.5 , pp. 1-5
- McMahon, T.J.¹ Berniard, T.J.² Albin, D.S.³

7
- 34548810303
- A physics-based crystallization model for retention in phase-change memories
- DOI 10.1109/RELPHY.2007.369949, 4227690, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
- U. Russo, D. Ielmini, and A. L. Lacaita, IEEE Int. Reliab. Phys. Symp. Proc. ZZZZZZ 1082-7285 547 (2007). 10.1109/RELPHY.2007.369949 (Pubitemid 47431997)
- (2007) Annual Proceedings - Reliability Physics (Symposium) , pp. 547-553
- Russo, U.¹ Ielmini, D.² Lacaita, A.L.³

8
- 33947243961
- Intrinsic data retention in nanoscaled phase-change memories - Part I: Monte Carlo model for crystallization and percolation
- DOI 10.1109/TED.2006.885527
- U. Russo, D. Ielmini, A. Redaelli, and A. L. Lacaita, IEEE Trans. Electron Devices IETDAI 0018-9383 53, 3032 (2006). 10.1109/TED.2006.885527 (Pubitemid 46417117)
- (2006) IEEE Transactions on Electron Devices , vol.53 , Issue.12 , pp. 3032-3039
- Russo, U.¹ Ielmini, D.² Redaelli, A.³ Lacaita, A.L.⁴

9
- 0003421806
- (Springer-Verlag, Berlin)
- A. L. Efros and B. I. Shklovskii, Electronic Properties of Doped Semiconductors (Springer-Verlag, Berlin, 1979).
- (1979) Electronic Properties of Doped Semiconductors
- Efros, A.L.¹ Shklovskii, B.I.²

10
- 34548758518
- Data retention characterization of phase-change memory arrays
- DOI 10.1109/RELPHY.2007.369948, 4227689, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
- B. Gleixner, A. Pirovano, J. Sarkar1, F. Ottogalli, E. Tortorelli, M. Tosi, and R. Bez, IEEE Int. Reliab. Phys. Symp. Proc. ZZZZZZ 1082-7285 542 (2007). 10.1109/RELPHY.2007.369948 (Pubitemid 47431996)
- (2007) Annual Proceedings - Reliability Physics (Symposium) , pp. 542-546
- Gleixner, B.¹ Pirovano, A.² Sarkar, J.³ Ottogalli, F.⁴ Tortorelli, E.⁵ Tosi, M.⁶ Bez, R.⁷

11
- 34948905228
- Anomalous cells with low reset resistance in phase-change-memory arrays
- DOI 10.1109/LED.2007.905367
- D. Mantegazza, D. Ielmini, A. Pirovano, and A. L. Lacaita, IEEE Electron Device Lett. EDLEDZ 0741-3106 28, 865 (2007). 10.1109/LED.2007.905367 (Pubitemid 47521563)
- (2007) IEEE Electron Device Letters , vol.28 , Issue.10 , pp. 865-867
- Mantegazza, D.¹ Ielmini, D.² Pirovano, A.³ Lacaita, A.L.⁴

12
- 77951865673
- APPLAB 0003-6951. 10.1063/1.3378813
- M. Nardone, M. Simon, and V. G. Karpov, Appl. Phys. Lett. APPLAB 0003-6951 96, 163501 (2010). 10.1063/1.3378813
- (2010) Appl. Phys. Lett. , vol.96 , pp. 163501
- Nardone, M.¹ Simon, M.² Karpov, V.G.³

13
- 0000512677
- PRLTAO 0031-9007. 10.1103/PhysRevLett.31.1304
- M. Pollak and J. J. Hauser, Phys. Rev. Lett. PRLTAO 0031-9007 31, 1304 (1973). 10.1103/PhysRevLett.31.1304
- (1973) Phys. Rev. Lett. , vol.31 , pp. 1304
- Pollak, M.¹ Hauser, J.J.²

14
- 0002553144
- edited by B. L. Altshuller, P. A. Lee, and R. A. Webb (Elsevier, New York)
- M. E. Raikh and I. M. Ruzin, in Mesoscopic Phenomena in Solids, edited by, B. L. Altshuller, P. A. Lee, and, R. A. Webb, (Elsevier, New York, 1991), p. 315.
- (1991) Mesoscopic Phenomena in Solids , pp. 315
- Raikh, M.E.¹ Ruzin, I.M.²

15
- 33748850259
- 2nd ed. (Dover, New York)
- G. A. Korn and T. M. Korn, Mathematical Handbook for Scientists and Engineers, 2nd ed. (Dover, New York, 2000).
- (2000) Mathematical Handbook for Scientists and Engineers
- Korn, G.A.¹ Korn, T.M.²

16
- 17444424589
- Diffusion in a half-space: From Lord Kelvin to path integrals
- DOI 10.1119/1.1842734
- M. Slutsky, Am. J. Phys. AJPIAS 0002-9505 73, 308 (2005). 10.1119/1.1842734 (Pubitemid 40551380)
- (2005) American Journal of Physics , vol.73 , Issue.4 , pp. 308-314
- Slutsky, M.¹

17
- 33947590032
- EDLEDZ 0741-3106. 10.1109/LED.2006.882527
- I. V. Karpov and S. A. Kostylev, IEEE Electron Device Lett. EDLEDZ 0741-3106 27, 808 (2006). 10.1109/LED.2006.882527
- (2006) IEEE Electron Device Lett. , vol.27 , pp. 808
- Karpov, I.V.¹ Kostylev, S.A.²

18
- 77952416665
- TDIMD5 0163-1918, 10.1109/IEDM.2009.5424229
- Y. H. Shih, M. H. Lee, M. Breitwisch, R. Cheek, J. Y. Wu, B. Rajendran, Y. Zhu, E. K. Lai, C. F. Chen, H. Y. Cheng, A. Schrott, E. Joseph, R. Dasaka, S. Raoux, H. L. Lung, and C. Lam, Tech. Dig.-Int. Electron Devices Meet. TDIMD5 0163-1918, 2009, 753 10.1109/IEDM.2009.5424229.
- Tech. Dig. - Int. Electron Devices Meet. , vol.2009 , pp. 753
- Shih, Y.H.¹ Lee, M.H.² Breitwisch, M.³ Cheek, R.⁴ Wu, J.Y.⁵ Rajendran, B.⁶ Zhu, Y.⁷ Lai, E.K.⁸ Chen, C.F.⁹ Cheng, H.Y.¹⁰ Schrott, A.¹¹ Joseph, E.¹² Dasaka, R.¹³ Raoux, S.¹⁴ Lung, H.L.¹⁵ Lam, C.¹⁶

19
- 51849123656
- JAPIAU 0021-8979. 10.1063/1.2973686
- V. G. Karpov, Y. A. Kryukov, I. V. Karpov, and M. Mitra, J. Appl. Phys. JAPIAU 0021-8979 104, 054507 (2008) 10.1063/1.2973686
- (2008) J. Appl. Phys. , vol.104 , pp. 054507
- Karpov, V.G.¹ Kryukov, Y.A.² Karpov, I.V.³ Mitra, M.⁴

20
- 37549051695
- JAPIAU 0021-8979 10.1063/1.2825650
- I. V. Karpov, M. Mitra, G. Spadini, U. Kau, Y. A. Kryukov, and V. G. Karpov, J. Appl. Phys. JAPIAU 0021-8979 102, 124503 (2007). 10.1063/1.2825650
- (2007) J. Appl. Phys. , vol.102 , pp. 124503
- Karpov, I.V.¹ Mitra, M.² Spadini, G.³ Kau, U.⁴ Kryukov, Y.A.⁵ Karpov, V.G.⁶

21
- 25144474892
- Crystal morphology and nucleation in thin films of amorphous Te alloys used for phase change recording
- DOI 10.1063/1.2034655, 054902
- J. A. Kalb, C. Y. Wen, F. Spaepen, H. Dieker, and M. Wuttig, J. Appl. Phys. JAPIAU 0021-8979 98, 054902 (2005). 10.1063/1.2034655 (Pubitemid 41345131)
- (2005) Journal of Applied Physics , vol.98 , Issue.5 , pp. 1-6
- Kalb, J.A.¹ Wen, C.Y.² Spaepen, F.³ Dieker, H.⁴ Wuttig, M.⁵

22
- 0003724744
- (Pergamon, New York)
- L. D. Landau and I. M. Lifshits, Electrodynamics of Continuous Media (Pergamon, New York, 1984).
- (1984) Electrodynamics of Continuous Media
- Landau, L.D.¹ Lifshits, I.M.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.