A physics-based crystallization model for retention in phase-change memories

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 547-553

  Russo, U ^a   Ielmini, D ^a   Lacaita, A L ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

Chalcogenide; Data retention; Phase change memory

Indexed keywords

CHALCOGENIDES; CRYSTALLINE MATERIALS; CRYSTALLIZATION; EXTRAPOLATION; GIBBS FREE ENERGY; LOW TEMPERATURE EFFECTS; MATHEMATICAL MODELS; NUCLEATION; PERCOLATION (FLUIDS);

AMORPHOUS PHASE; DATA RETENTION; GROWTH PARAMETERS;

PHASE CHANGE MEMORY;

EID: 34548810303     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369949     Document Type: Conference Paper

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