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Volumn 97, Issue 5, 2005, Pages

Nonlinear shunt paths in thin-film CdTe solar cells

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT ELEMENTS; DARK-CURRENT TRANSIENT; INTERCONNECT RESISTANCE; THIN FILM SOLAR CELLS;

EID: 20444493159     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1856216     Document Type: Article
Times cited : (37)

References (10)
  • 1
    • 79956026462 scopus 로고    scopus 로고
    • Effects of nonuniformity in thin-film photovoltaics
    • V. G. Karpov, A. D. Compaan, and D. Shvdka, " Effects of nonuniformity in thin-film photovoltaics., " Appl. Phys. Lett. 80, 4256 (2002).
    • (2002) Appl. Phys. Lett. , vol.80 , pp. 4256
    • Karpov, V.G.1    Compaan, A.D.2    Shvdka, D.3
  • 3
    • 0036953392 scopus 로고    scopus 로고
    • Proceedings of the 29th IEEE Photovoltaic Specialists Conference, New Orleans, LA, May
    • T. J. McMahon, " Dark-current transients in thin-film CdTe solar cells., " Proceedings of the 29th IEEE Photovoltaic Specialists Conference, New Orleans, LA, May 2002, p. 768.
    • (2002) Dark-current Transients in Thin-film CdTe Solar Cells , pp. 768
    • McMahon, T.J.1
  • 8
    • 35949005303 scopus 로고
    • Switching in a -Si devices
    • M. Jafar and D. Haneman, " Switching in a -Si devices., " Phys. Rev. B 49, 13611 (1994).
    • (1994) Phys. Rev. B , vol.49 , pp. 13611
    • Jafar, M.1    Haneman, D.2
  • 9
    • 0029487755 scopus 로고
    • Tutorial: Electrolytic models for metallic electromigration failure mechanisms
    • S. J. Krumbein, " Tutorial: Electrolytic models for metallic electromigration failure mechanisms., " IEEE Trans. Reliab. 44, 539 (1995).
    • (1995) IEEE Trans. Reliab. , vol.44 , pp. 539
    • Krumbein, S.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.