-
1
-
-
0035717521
-
OUM - A 180 nm non-volatile memory cell element technology for stand alone and embedded applications
-
Stefan Lai and Tyler Lowrey, "OUM - A 180 nm non-volatile memory cell element technology for stand alone and embedded applications," IEDM Technical Digest, 36-5, p.803, 2001
-
(2001)
IEDM Technical Digest
, vol.36
, Issue.5
, pp. 803
-
-
Lai, S.1
Lowrey, T.2
-
2
-
-
36049053305
-
Reversible electrical switching phenomena in disordered structures
-
Nov. 11
-
Stanford R. Ovshinsky, "Reversible electrical switching phenomena in disordered structures," Physical Review Letter Vol.21, No.20, pp.1450-1453, Nov. 11, 1968
-
(1968)
Physical Review Letter
, vol.21
, Issue.20
, pp. 1450-1453
-
-
Ovshinsky, S.R.1
-
3
-
-
79952501265
-
An access-transistor-free (0T/1R) non-volatile resistance random access memory (RRAM) using a novel threshold switching, self-rectifying chalcogenide device
-
Yi-Chou Chen, C.F. Chen, C.T. Chen, J.Y. Yu, S. Wu, S.L. Lung, Rich Liu and Chih-Yuan Lu, "An access-transistor-free (0T/1R) non-volatile resistance random access memory (RRAM) using a novel threshold switching, self-rectifying chalcogenide device," IEDM Technical Digest, '03, S37P4
-
IEDM Technical Digest, '03
-
-
Chen, Y.-C.1
Chen, C.F.2
Chen, C.T.3
Yu, J.Y.4
Wu, S.5
Lung, S.L.6
Liu, R.7
Lu, C.-Y.8
-
4
-
-
77952396034
-
Full integration and reliability evaluation of phase-change RAM based on 0.24μm-CMOS technologies
-
Y.N. Hwang, J.S. Hong, S.H. Lee, S.J. Ahn, G.T. Jeong, G.H. Koh, J.H. Oh, H.J. Kim, W.C. Jeong, S.Y. Lee, J.H. Park, K.C. Ryoo, H. Horii, Y.H. Ha, J.H. Yi, W.Y. Cho, Y.T. Kim, K.H. Lee, S.H. Joo, S.O. Park, U.I. Chung, H.S. Jeong and Kinam Kim, "Full integration and reliability evaluation of phase-change RAM based on 0.24μm-CMOS technologies," Symposium on VLSI, 2003, T12B3
-
(2003)
Symposium on VLSI
-
-
Hwang, Y.N.1
Hong, J.S.2
Lee, S.H.3
Ahn, S.J.4
Jeong, G.T.5
Koh, G.H.6
Oh, J.H.7
Kim, H.J.8
Jeong, W.C.9
Lee, S.Y.10
Park, J.H.11
Ryoo, K.C.12
Horii, H.13
Ha, Y.H.14
Yi, J.H.15
Cho, W.Y.16
Kim, Y.T.17
Lee, K.H.18
Joo, S.H.19
Park, S.O.20
Chung, U.I.21
Jeong, H.S.22
Kim, K.23
more..
-
5
-
-
41149134446
-
A 90nm phase change memory technology for stand-alone non-volatile memory applications
-
T15B3
-
Fabio Pellizzer, Augusto Benvenuti, Robert Gleixner, Yudong Kim, Brian Johnson, Michele Magistretti, Tina Marangon, Agostino Pirovano, Roberto Bez and Greg Atwood, "A 90nm phase change memory technology for stand-alone non-volatile memory applications," Symposium on VLSI Technology, p. 122, 2006, T15B3.
-
(2006)
Symposium on VLSI Technology
, pp. 122
-
-
Pellizzer, F.1
Benvenuti, A.2
Gleixner, R.3
Kim, Y.4
Johnson, B.5
Magistretti, M.6
Marangon, T.7
Pirovano, A.8
Bez, R.9
Atwood, G.10
-
6
-
-
46049090421
-
Full integration of highly manufacturable 512Mb PRAM based on 90nm technology
-
J. H. Oh, J.H. Park, Y.S. Lim, H.S. Lim, Y.T. Oh, J.S. Kim, J.M. Shin, J.H. Park, Y.J. Song, K.C. Ryoo, D.W. Lim, S.S. Park, J.I. Kim, J.H. Kim, J. Yu, F. Yeung, C.W. Jeong, J.H. Kong, D.H. Kang, G.H. Koh, G.T. Jeong, H.S. Jeong and Kinam Kim, "Full integration of highly manufacturable 512Mb PRAM based on 90nm technology," IEDM Technical Digest, 2006, S2P6.
-
(2006)
IEDM Technical Digest
-
-
Oh, J.H.1
Park, J.H.2
Lim, Y.S.3
Lim, H.S.4
Oh, Y.T.5
Kim, J.S.6
Shin, J.M.7
Park, J.H.8
Song, Y.J.9
Ryoo, K.C.10
Lim, D.W.11
Park, S.S.12
Kim, J.I.13
Kim, J.H.14
Yu, J.15
Yeung, F.16
Jeong, C.W.17
Kong, J.H.18
Kang, D.H.19
Koh, G.H.20
Jeong, G.T.21
Jeong, H.S.22
Kim, K.23
more..
-
7
-
-
71049151621
-
2 cell size driven by low-contact-resistivity poly-Si diode
-
Y. Sasago, M. Kinoshita, T. Morikawa, K. Kurotsuchi, S. Hanzawa, T. Mine, A. Shima, Y. Fujisaki, H. Kume, H. Moriya, N. Takaura and K. Torii, "Cross-point phase change memory with 4F2 cell size driven by low-contact-resistivity poly-Si diode," Symposium on VLSI Technology, 2009, T2B1.
-
(2009)
Symposium on VLSI Technology
-
-
Sasago, Y.1
Kinoshita, M.2
Morikawa, T.3
Kurotsuchi, K.4
Hanzawa, S.5
Mine, T.6
Shima, A.7
Fujisaki, Y.8
Kume, H.9
Moriya, H.10
Takaura, N.11
Torii, K.12
-
8
-
-
35949040018
-
The mechanism of threshold switching in amorphous alloys
-
David Adler, Heinz K. Henisch and Sir Nevill Mott, "The mechanism of threshold switching in amorphous alloys," Review of Modern Physics, Vol.50, No.2 pp.209-220, 1978.
-
(1978)
Review of Modern Physics
, vol.50
, Issue.2
, pp. 209-220
-
-
Adler, D.1
Henisch, H.K.2
Mott, S.N.3
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