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Review of Scientific Instruments

Volumn 81, Issue 9, 2010, Pages

Atomic force microscopy imaging using a tip-on-chip: Opening the door to integrated near field nanotools

(8) Hayton, J a,c Polesel Maris, J b Demadrille, R a Brun, M a Thoyer, F b Lubin, C b Cousty, J b Grvin B a

a CEA GRENOBLE (France)

b CEA SACLAY (France)

c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGING; ATOMIC FORCE; CONTRAST IMAGING; EXPERIMENTAL SPECTRA; FORCE SPECTROSCOPY; ION BEAM DEPOSITION; LATERAL RESOLUTION; LOW-FREQUENCY MODES; MESOSCOPICS; NANOTOOLS; NEAR FIELDS; NUMERICAL SIMULATION; ON CHIPS; QUARTZ TUNING FORK; SILICON-BASED; VIBRATION MODES; WEAK INTERACTIONS;

AMPLITUDE MODULATION; CHEMICAL MODIFICATION; MODAL ANALYSIS; QUARTZ; VIBRATION ANALYSIS;

ATOMIC FORCE MICROSCOPY;

EID: 77957713603 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3477996 Document Type: Article

Times cited : (5)

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