Use of isotopic tracers and SIMS analysis for evaluating the oxidation behaviour of protective coatings on nickel based superalloys

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 630-633

  Alibhai, A A ^a   Chater, R J ^a   McPhail, D S ^a   Shollock, B A ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Alumina scales; FIB; Isotopic tracer experiments; Pt Al coatings; SIMS

Indexed keywords

DIFFUSION; ION BEAMS; NICKEL ALLOYS; OXIDATION; OXYGEN; PROTECTIVE COATINGS; SECONDARY ION MASS SPECTROMETRY; SUPERALLOYS;

ISOTOPIC TRACERS;

SURFACE PHENOMENA;

EID: 0037437875     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00780-8     Document Type: Conference Paper

References (5)

1. M.J. Graham, Microscopy of Oxidation, Vol. 500, (1990) Institute of Materials, pp. 10-18.
2. Jedlinski J., Borchardt G., Mrowec S. Solid State Ionics. 50:1992;67-74.
3. Garriga-Majo D.et al. J. Inorg. Mater. 1:1999;325-336.
4. Pint B.A., Martin J.R., Hobbs L.W. Oxidation Met. 39:1993;167.
5. Basu S.N., Halloran J.W. Oxidation Met. 27(3/4):1987;142-155.