Transmission electron microscopy and reflected high-energy electron-diffraction investigation of plastic relaxation in doped and undoped ZnSe/GaAs(001)

Journal of Applied Physics

Volumn 79, Issue 8, 1996, Pages 4124-4131

  Rosenauer, A ^a   Reisinger, T ^a   Franzen, F ^a   Schutz G ^a   Hahn, B ^a   Wolf, K ^a   Zweck, J ^a   Gebhardt, W ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001034673     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361776     Document Type: Article

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