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Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 8, 2010, Pages

Origin of the bias stress instability in single-crystal organic field-effect transistors

(6) Lee, B a Wan, A a Mastrogiovanni, D a Anthony, J E b Garfunkel, E a,c Podzorov, V a,c

a RUTGERS UNIVERSITY (United States)

b UNIVERSITY OF KENTUCKY (United States)

c RUTGERS UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957557366 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.82.085302 Document Type: Article

Times cited : (80)

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