Effect of interfacial shallow traps on polaron transport at the surface of organic semiconductors

Physical Review Letters

Volumn 98, Issue 9, 2007, Pages

  Calhoun, M F ^a   Hsieh, C ^a   Podzorov, V ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRON MOBILITY; ELECTRON TRAPS; FIELD EFFECT TRANSISTORS; HOLE TRAPS; SEMICONDUCTING ORGANIC COMPOUNDS;

HOLE TRANSFER; INTERFACIAL SHALLOW TRAPS; POLARON TRANSPORT; SEMICONDUCTOR DIELECTRIC INTERFACES;

POLARONS;

EID: 33847685582     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.98.096402     Document Type: Article

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