Focused ion beam characterization of bicomponent polymer fibers

Microscopy and Microanalysis

Volumn 16, Issue 3, 2010, Pages 282-290

  Wong, K C ^a,b   Haslauer, C M ^a   Anantharamaiah, N ^a   Pourdeyhimi, B ^a   Batchelor, A D ^a,b   Griffis, D P ^a,b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b North Carolina State University   (United States)

Author keywords

biaxial cross section; bicomponent polymer fiber; characterization; differential sputtering; focused ion beam; ion induced secondary electron imaging

Indexed keywords

EID: 77957223467     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610000115     Document Type: Article

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