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Volumn 45, Issue 6, 2007, Pages 677-683

Three-dimensional structural analysis of a block copolymer by scanning electron microscopy combined with a focused ion beam

Author keywords

Block copolymers; Focused ion beam (FIB); Lamellar; Scanning electron microscopy (SEM); Submicrometer and micrometer scale morphologies; Three dimensional (3D) reconstruction; Transmission electron microtomography (TEMT)

Indexed keywords

FOCUSED ION BEAMS; IMAGE RECONSTRUCTION; LAMELLAR STRUCTURES; MICROMETERS; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL;

EID: 33947588343     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.21088     Document Type: Article
Times cited : (52)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.