Focused ion beam (FIB) etching to investigate aluminium-coated polymer laminates subjected to heat and moisture loads

Surface and Coatings Technology

Volumn 202, Issue 24, 2008, Pages 6054-6063

  Brunner, S ^a   Tharian, P J ^a   Simmler, H ^a   Ghazi Wakili, K ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Aluminium; Barrier envelopes; Ion bombardment; Multilayer; Scanning electron microscopy; Vacuum evaporation

Indexed keywords

ALUMINUM; ALUMINUM CLADDING; BEAM PLASMA INTERACTIONS; CLADDING (COATING); ELECTRON EMISSION; ETCHING; FOCUSED ION BEAMS; ION BEAMS; ION BOMBARDMENT; LIGHT METALS; MOISTURE; PAPER; PAPER LAMINATES; PLASTIC COATINGS; POLYMERS; VACUUM; VACUUM APPLICATIONS;

ADHESIVE LAYERS; ALUMINIUM; BARRIER ENVELOPES; BARRIER FUNCTIONS; BARRIER LAYERS; BUILDING APPLICATIONS; CLIMATIC CONDITIONS; EXPECTED LIFETIME; EXTERNAL-; FOCUSED ION BEAM ETCHING; HIGH PERFORMANCE THERMAL INSULATION; MULTI-LAYERED; MULTILAYER; POLYMER LAMINATES; SCANNING ELECTRON MICROSCOPY; STRESS INDUCED; VACUUM EVAPORATION; VACUUM INSULATION PANELS; VACUUM WEB COATING;

THERMAL INSULATION;

EID: 50449093114     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2008.07.010     Document Type: Article

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