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Volumn 108, Issue 5, 2010, Pages

Microstructural characteristics and phonon structures in luminescence from surface oxidized Ge nanocrystals embedded in HfO2 matrix

(5) Das, S a Singha, R K a Gangopadhyay, S b Dhar, A a Ray, S K a

a INDIAN INSTITUTE OF TECHNOLOGY (India)

b UNIVERSITY OF NOTTINGHAM (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED SAMPLES; ELECTRONIC EXCITATION; FINE STRUCTURES; GE NANOCRYSTALS; LOCAL VIBRATIONS; MATRIX; MICROSTRUCTURAL CHARACTERISTICS; PHONON STRUCTURES; PHOTOLUMINESCENCE PEAK; RF MAGNETRON SPUTTERING TECHNIQUE; ROOM TEMPERATURE; SPECTRAL ANALYSIS; SPHERICAL SHAPE; STRONG COUPLING; TEMPERATURE DEPENDENT PHOTOLUMINESCENCES; TRANSMISSION ELECTRON MICROGRAPH; VISIBLE AND ULTRAVIOLET;

COLOR CENTERS; GERMANIUM OXIDES; HAFNIUM COMPOUNDS; MAGNETRON SPUTTERING; NANOCRYSTALS; PHOTOLUMINESCENCE; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS; X RAY PHOTOELECTRON SPECTROSCOPY;

GERMANIUM;

EID: 77956840640 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3475717 Document Type: Article

Times cited : (14)

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