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Volumn 12, Issue , 2010, Pages

Dissociative electron attachment to the highly reactive difluoromethylene molecule-importance of CF2for negative ion formation in fluorocarbon plasmas

Author keywords

[No Author keywords available]

Indexed keywords

ATOM REACTIONS; CROSS SECTION; DISSOCIATIVE ELECTRON ATTACHMENT; FLUOROCARBON PLASMA; FOUR-ORDER; MICROWAVE PLASMA; SCATTERING CALCULATIONS; UPPER LIMITS;

EID: 77956571091     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/8/083035     Document Type: Article
Times cited : (16)

References (36)
  • 11
    • 0003450764 scopus 로고    scopus 로고
    • Linstrom P J and Mallard W G (ed) NIST Chemistry WebBook,(Gaithersburg MD: National Institute of Standards and Technology)
    • Linstrom P J and Mallard W G (ed) 2005 NIST Chemistry WebBook, NIST Standard Reference Database Number 69 (available online: http://webbook.nist.gov 2006-2008) (Gaithersburg MD: National Institute of Standards and Technology)
    • (2005) NIST Standard Reference Database Number 69
  • 23
    • 33746399829 scopus 로고    scopus 로고
    • version 3.0, available online: (Gaithersburg MD: National Institute of Standards and Technology)
    • Kim Y-K et al 2004 Electron-Impact Cross sections for Ionization and Excitation (version 3.0, available online: http://physics.nist.gov/ionxsec 2006-2008) (Gaithersburg MD: National Institute of Standards and Technology)
    • (2004) Electron-Impact Cross Sections for Ionization and Excitation
    • Kim, Y.-K.1
  • 35
    • 77956608580 scopus 로고    scopus 로고
    • Deutsch H, Maerk T D, Tarnovsky V, Becker K, Cornelissen C, Cespiva L and Bonacic-Koutecky V 1994
    • Deutsch H, Maerk T D, Tarnovsky V, Becker K, Cornelissen C, Cespiva L and Bonacic-Koutecky V 1994


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.