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Volumn 120, Issue 20, 2004, Pages 9499-9508
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Use of the ultraviolet absorption spectrum of CF 2 to determine the spatially resolved absolute CF 2 density, rotational temperature, and vibrational distribution in a plasma etching reactor
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Author keywords
[No Author keywords available]
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Indexed keywords
BOLTZMANN DISTRIBUTIONS;
FRANCK-CONDON FACTORS;
PLASMA ETCH REACTORS;
VIBRATIONAL ENERGY;
ABSORPTION SPECTROSCOPY;
DIELECTRIC MATERIALS;
FLUOROCARBONS;
GROUND STATE;
INTEGRATED CIRCUITS;
LIGHT ABSORPTION;
MIXTURES;
MOLECULAR VIBRATIONS;
PLASMA ETCHING;
PLASMAS;
SILICON WAFERS;
CARBON INORGANIC COMPOUNDS;
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EID: 2942529083
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1695313 Document Type: Article |
Times cited : (38)
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References (27)
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