SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 81, Issue 8, 2010, Pages

Note: Multiscale scanning probe microscopy

(7) Chassagne, L a Blaize, S b Ruaux, P a Topu S a Royer, P b Alayli, Y a Lrondel G b

a LABORATOIRE DES SCIENCES DU CLIMAT ET DE L ENVIRONNEMENT (France)

b UNIVERSITÉ DE TECHNOLOGIE DE TROYES (France)

Author keywords

[No Author keywords available]

Indexed keywords

ENGINEERED NANOMATERIALS; FORCE MICROSCOPY; MILLIMETER RANGE; MULTISCALES; NANOMETRIC RESOLUTION; NANOMETRICS; PIEZOFORCE MICROSCOPY; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING PROBE TECHNIQUES; SCIENTIFIC FIELDS;

MATERIALS PROPERTIES; PROBES; SCANNING; SCANNING PROBE MICROSCOPY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; INSTRUMENTATION; MECHANICS; MICROTECHNOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY;

MECHANICAL PROCESSES; MICROSCOPY, ATOMIC FORCE; MICROTECHNOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY OF RESULTS;

EID: 77956322864 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3473935 Document Type: Review

Times cited : (8)

References (15)

1
- 70349680728
- NNOTER 0957-4484. 10.1088/0957-4484/20/43/430206
- J. Brugger, Nanotechnology NNOTER 0957-4484 20, 430206 (2009). 10.1088/0957-4484/20/43/430206
- (2009) Nanotechnology , vol.20 , pp. 430206
- Brugger, J.¹

2
- 70349653758
- NNOTER 0957-4484. 10.1088/0957-4484/20/43/430202
- A. Engel, Nanotechnology NNOTER 0957-4484 20, 430202 (2009). 10.1088/0957-4484/20/43/430202
- (2009) Nanotechnology , vol.20 , pp. 430202
- Engel, A.¹

3
- 70349680730
- NNOTER 0957-4484. 10.1088/0957-4484/20/43/430201
- M. Reed, Nanotechnology NNOTER 0957-4484 20, 430201 (2009). 10.1088/0957-4484/20/43/430201
- (2009) Nanotechnology , vol.20 , pp. 430201
- Reed, M.¹

4
- 70349690416
- NNOTER 0957-4484. 10.1088/0957-4484/20/43/430204
- A. Forchel, Nanotechnology NNOTER 0957-4484 20, 430204 (2009). 10.1088/0957-4484/20/43/430204
- (2009) Nanotechnology , vol.20 , pp. 430204
- Forchel, A.¹

5
- 70349664415
- NNOTER 0957-4484. 10.1088/0957-4484/20/43/430203
- M. Meyyappan, Nanotechnology NNOTER 0957-4484 20, 430203 (2009). 10.1088/0957-4484/20/43/430203
- (2009) Nanotechnology , vol.20 , pp. 430203
- Meyyappan, M.¹

6
- 67649235467
- NNOTER 0957-4484. 10.1088/0957-4484/20/25/255701
- O. Ovchinnikov, S. Jesse, and S. V. Kalinin, Nanotechnology NNOTER 0957-4484 20, 255701 (2009). 10.1088/0957-4484/20/25/255701
- (2009) Nanotechnology , vol.20 , pp. 255701
- Ovchinnikov, O.¹ Jesse, S.² Kalinin, S.V.³

7
- 70349678931
- NNOTER 0957-4484. 10.1088/0957-4484/20/43/430208
- M. Miles, Nanotechnology NNOTER 0957-4484 20, 430208 (2009). 10.1088/0957-4484/20/43/430208
- (2009) Nanotechnology , vol.20 , pp. 430208
- Miles, M.¹

8
- 70350671426
- MSTCEP 0957-0233. 10.1088/0957-0233/20/8/084026
- C. Recknagel and H. Rothe, Meas. Sci. Technol. MSTCEP 0957-0233 20, 084026 (2009). 10.1088/0957-0233/20/8/084026
- (2009) Meas. Sci. Technol. , vol.20 , pp. 084026
- Recknagel, C.¹ Rothe, H.²

9
- 9644266690
- MRTEEO 1059-910X. 10.1002/jemt.20102
- R. Bachelot, G. Ĺrondel, S. Blaize, S. Aubert, A. Bruyant, and P. Royer, Microsc. Res. Tech. MRTEEO 1059-910X 64, 441 (2004). 10.1002/jemt.20102
- (2004) Microsc. Res. Tech. , vol.64 , pp. 441
- Bachelot, R.¹ Ĺrondel, G.² Blaize, S.³ Aubert, S.⁴ Bruyant, A.⁵ Royer, P.⁶

10
- 27444444618
- MSTCEP 0957-0233. 10.1088/0957-0233/16/11/001
- J. A. Kramar, Meas. Sci. Technol. MSTCEP 0957-0233 16, 2121 (2005). 10.1088/0957-0233/16/11/001
- (2005) Meas. Sci. Technol. , vol.16 , pp. 2121
- Kramar, J.A.¹

11
- 33751114173
- (Wiley-VCH, New York)
- G. Wilkening and L. Koenders, Nanoscale Calibration Standards and Methods (Wiley-VCH, New York, 2005).
- (2005) Nanoscale Calibration Standards and Methods
- Wilkening, G.¹ Koenders, L.²

12
- 36248984190
- MSTCEP 0957-0233. 10.1088/0957-0233/18/11/001
- L. Chassagne, M. Wakim, S. Xu, S. Top̧u, P. Ruaux, P. Juncar, and Y. Alayli, Meas. Sci. Technol. MSTCEP 0957-0233 18, 3267 (2007). 10.1088/0957-0233/18/11/001
- (2007) Meas. Sci. Technol. , vol.18 , pp. 3267
- Chassagne, L.¹ Wakim, M.² Xu, S.³ Top̧u, S.⁴ Ruaux, P.⁵ Juncar, P.⁶ Alayli, Y.⁷

13
- 24144469767
- MSTCEP 0957-0233. 10.1088/0957-0233/16/9/008
- L. Chassagne, S. Topcu, Y. Alayli, and P. Juncar, Meas. Sci. Technol. MSTCEP 0957-0233 16, 1771 (2005). 10.1088/0957-0233/16/9/008
- (2005) Meas. Sci. Technol. , vol.16 , pp. 1771
- Chassagne, L.¹ Topcu, S.² Alayli, Y.³ Juncar, P.⁴

14
- 34848913724
- RSINAK 0034-6748. 10.1063/1.2773623
- A. Sinno, P. Ruaux, L. Chassagne, S. Top̧u, Y. Alayli, G. Ĺrondel, S. Blaize, A. Bruyant, and P. Royer, Rev. Sci. Instrum. RSINAK 0034-6748 78, 095107 (2007). 10.1063/1.2773623
- (2007) Rev. Sci. Instrum. , vol.78 , pp. 095107
- Sinno, A.¹ Ruaux, P.² Chassagne, L.³ Top̧u, S.⁴ Alayli, Y.⁵ Ĺrondel, G.⁶ Blaize, S.⁷ Bruyant, A.⁸ Royer, P.⁹

15
- 69749095235
- JAPIAU 0021-8979. 10.1063/1.3200953
- G. Ĺrondel, A. Sinno, L. Chassagne, S. Blaize, P. Ruaux, A. Bruyant, S. Top̧u, P. Royer, and Y. Alayli, J. Appl. Phys. JAPIAU 0021-8979 106, 044913 (2009). 10.1063/1.3200953
- (2009) J. Appl. Phys. , vol.106 , pp. 044913
- Ĺrondel, G.¹ Sinno, A.² Chassagne, L.³ Blaize, S.⁴ Ruaux, P.⁵ Bruyant, A.⁶ Top̧u, S.⁷ Royer, P.⁸ Alayli, Y.⁹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.