SCOPUS 정보 검색 플랫폼

Nanotechnology

Volumn 20, Issue 25, 2009, Pages

Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry

(3) Ovchinnikov, Oleg S a Jesse, S b Kalinin, S V b

a UNIVERSITY OF TENNESSEE (United States)

b OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE SCANNING; CORRELATION FUNCTION; DISORDERED MEDIA; INFORMATION DENSITY; INTERFACE GEOMETRY; MULTI-RESOLUTION; NONUNIFORM; PIEZORESPONSE FORCE MICROSCOPY; RESOLUTION EFFECTS; SELF-AFFINE; STRUCTURE FACTORS;

ELECTRIC WIRE; PROBES; SCANNING PROBE MICROSCOPY;

SCANNING;

ARTICLE; CORRELATION FUNCTION; GEOMETRY; IMAGE QUALITY; MICROSCOPY; OPTICAL RESOLUTION; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY;

EID: 67649235467 PISSN: 09574484 EISSN: 13616528 Source Type: Journal
DOI: 10.1088/0957-4484/20/25/255701 Document Type: Article

Times cited : (26)

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