Enlarged near-field optical imaging

Journal of Applied Physics

Volumn 106, Issue 4, 2009, Pages

  Lerondel G ^a   Sinno, A ^b   Chassagne, L ^b   Blaize, S ^a   Ruaux, P ^b   Bruyant, A ^a   Topcu S ^b   Royer, P ^a   Alayli, Y ^b  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^b Universite de Versailles Saint Quentin   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; EFFECTIVE INDEX; GLASS WAVEGUIDES; INTEGRATED OPTICAL COMPONENTS; LONG RANGE; MULTISCALE COMPONENTS; NANOMETRIC SCALE; NEAR FIELD IMAGING; NEAR FIELD OPTICAL MICROSCOPY; NEAR INFRARED; NEAR-FIELD OPTICAL IMAGING; OPTICAL MAPPING; PARAMETER RETRIEVAL; STATIONARY WAVES; TRANSLATION STAGE; WAVEGUIDE MODE;

FOURIER ANALYSIS; LIGHT TRANSMISSION; UNCERTAINTY ANALYSIS; WAVEGUIDES;

OPTICAL MICROSCOPY;

EID: 69749095235     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3200953     Document Type: Article

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