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Volumn 20, Issue 8, 2009, Pages

A concept for automated nanoscale atomic force microscope (AFM) measurements using a priori knowledge

Author keywords

AFM; Atomic force microscopy; Coordinate measurement; Nanometrology

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE SEGMENTATION; MARKUP LANGUAGES; MICROSCOPES; TEMPLATE MATCHING;

EID: 70350671426     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/8/084026     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.