Piezoresponse force microscopy investigations of Aurivillius phase thin films

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

  Keeney, Lynette ^a   Zhang, Panfeng F ^a   Groh, Claudia ^b   Pemble, Martyn E ^a   Whatmore, Roger W ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AURIVILLIUS PHASE; CRYSTALLINITIES; ELECTROMECHANICAL RESPONSE; PEROVSKITE LAYERS; PIEZORESPONSE FORCE MICROSCOPY; SI SUBSTRATES; SOL-GEL SYNTHESIS;

GELS; MANGANESE; MANGANESE COMPOUNDS; PEROVSKITE; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

BISMUTH COMPOUNDS;

EID: 77956301676     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3474959     Document Type: Conference Paper

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