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Integrated Ferroelectrics

Volumn 98, Issue 1, 2008, Pages 136-143

Electron backscatter diffraction and piezoresponse force microscopy study of bulk and thin film pzt samples

(5) Lowe, M J a Hegarty, T a Mingard, K a Li, J a Cain, M G a

a NATIONAL PHYSICAL LABORATORY (United Kingdom)

Author keywords

Domains; EBSD; Ferroelectric; PFM; Piezoelectric

Indexed keywords

DOMAINS; EBSD; FERROELECTRIC; PFM; PIEZOELECTRIC;

BACKSCATTERING; ELECTRON DIFFRACTION; FERROELECTRICITY; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; SEMICONDUCTING LEAD COMPOUNDS; THIN FILMS;

FERROELECTRIC MATERIALS;

EID: 65949117823 PISSN: 10584587 EISSN: 16078489 Source Type: Journal
DOI: 10.1080/10584580802162549 Document Type: Article

Times cited : (5)

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