Test generation based diagnosis of device parameters for analog circuits

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 596-602

  Chatterjee, Sasikumar ^a   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAUSE-EFFECT ANALYSIS; DEVICE GEOMETRIES; DEVICE PARAMETERS; INTEGRATED CIRCUITS (ICS); MANUFACTURING PROCESS; PERFORMANCE METRICS; RANDOM FLUCTUATION; TEST GENERATIONS;

EXHIBITIONS; INDUSTRIAL ENGINEERING;

PRODUCTION ENGINEERING;

EID: 77956262460     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915084     Document Type: Conference Paper

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