Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn 2000-January, Issue , 2000, Pages 562-567

  Chakrabarti, Sudip ^a   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG CIRCUITS; COMPUTER AIDED DESIGN; SOFTWARE TESTING; TRANSIENT ANALYSIS; ALGORITHMS; COMPUTER SIMULATION; DESIGN FOR TESTABILITY; FREQUENCY DOMAIN ANALYSIS; MEASUREMENT ERRORS; WAVEFORM ANALYSIS;

CIRCUIT UNDER TEST; COMPONENT TOLERANCES; DETECTION AND DIAGNOSIS; FAULT ORIENTED TEST GENERATIONS; MODERATE COMPLEXITY; SIGNAL GENERATION; TEST DEVELOPMENT; TEST GENERATIONS;

FAULT DETECTION; LINEAR NETWORK ANALYSIS;

ANALOG CIRCUITS; CIRCUIT UNDER TEST;

EID: 0034474930     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2000.896532     Document Type: Conference Paper

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