Minimal length diagnostic tests for analog circuits using test history

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1999, Pages 189-194

  Gomes, Alfred V ^a   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSTIC TESTS; DIVIDE AND CONQUER; FAULT DROPPING; MEASUREMENT PROCEDURES; MINIMAL LENGTHS; SIMULATION AND OPTIMIZATION; TEST GENERATIONS; TRANSIENT TESTS;

ANALOG CIRCUITS; EXHIBITIONS;

TESTING;

EID: 0002414249     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1999.761120     Document Type: Conference Paper

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