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Volumn 268, Issue 19, 2010, Pages 3186-3190

Study of defects in implanted silica glass by depth profiling Positron Annihilation Spectroscopy

Author keywords

Ion implantation; Positronium; Positrons; Silica glass

Indexed keywords

COINCIDENCE DOPPLER BROADENING SPECTROSCOPIES; DOPPLER BROADENING SPECTROSCOPY; IMPLANTED IONS; LIFETIME SPECTROSCOPY; NANO-VOIDS; POSITRON BEAMS; POSITRONIUM; SILICA GLASS;

EID: 77956171371     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.05.084     Document Type: Conference Paper
Times cited : (13)

References (27)
  • 1
    • 0004004240 scopus 로고
    • A. Dupasquier, A.P. Mills, Jr. (Eds.) North-Holland, Amsterdam
    • A. Dupasquier, A.P. Mills, Jr. (Eds.), Positron Spectroscopy of Solids, North-Holland, Amsterdam, 1995.
    • (1995) Positron Spectroscopy of Solids
  • 15
    • 0020238735 scopus 로고
    • P.G. Coleman, S.C. Sharma, L.M. Diana (Eds.) North Holland, Amsterdam
    • M. Eldrup, in: P.G. Coleman, S.C. Sharma, L.M. Diana (Eds.), Positron Annihilation, North Holland, Amsterdam, 1982, pp. 753-772.
    • (1982) Positron Annihilation , pp. 753-772
    • Eldrup, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.