Coincident Doppler-broadening spectroscopy of Si, amorphous SiO 2, and α-quartz using mono-energetic positrons

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 6, Issue 11, 2009, Pages 2459-2461

  Hugenschmidt, C ^a   Pikart, P ^a   Schreckenbach, K ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS QUARTZ; CRYSTALLINE QUARTZ; DOPPLER; DOPPLER BROADENING SPECTROSCOPY; NEPOMUC; POSITRON BEAMS; POSITRON IMPLANTATION; POSITRON SOURCES; SI SURFACES; SINGLE-CRYSTALLINE;

AMORPHOUS SILICON; CRYSTALLINE MATERIALS; OXIDE MINERALS; OXYGEN; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; QUARTZ; SILICON; SILICON COMPOUNDS; SILICON OXIDES;

ELECTRONS;

EID: 72449121432     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200982100     Document Type: Conference Paper

References (8)

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