Defects in SiO2 glass irradiated with high energy Ar ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 146, Issue 1-4, 1998, Pages 455-461

  Zhu, Zhiyong ^a   Jin, Yunfan ^a   Li, Changlin ^a   Sun, Youmei ^a   Zhang, Chonghong ^a   Meng, Qinghua ^a  

^a INSTITUTE OF MODERN PHYSICS   (China)

Author keywords

Defect; Irradiation; SiO2 glass

Indexed keywords

ARGON; DOSIMETRY; ELECTRON SPIN RESONANCE SPECTROSCOPY; GLASS; POSITRONS; RADIATION DAMAGE; SILICA; ULTRAVIOLET SPECTROSCOPY;

HIGH ENERGY IONS; POSITRON LIFETIME SPECTROSCOPY;

ION BOMBARDMENT;

EID: 0032477043     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00477-7     Document Type: Article

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