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Volumn 217, Issue 1, 1997, Pages 72-78
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Crystallization of silica studied by positron annihilation
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
CRYSTALLIZATION;
DOPPLER EFFECT;
GLASS;
PHASE INTERFACES;
SPECTRUM ANALYSIS;
VOLUME FRACTION;
POSITRON ANNIHILATION;
POSITRON LIFETIME SPECTROSCOPY;
SILICA;
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EID: 0031549266
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(97)00104-X Document Type: Article |
Times cited : (29)
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References (13)
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