Comments on 'on the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope' by Morawiec & Bouzy (2006)

Journal of Applied Crystallography

Volumn 39, Issue 1, 2006, Pages 104-105

  Rauch, Edgar F ^a   Dupuy, Laurent ^a,b  

^a UNIV GRENOBLE ALPES   (France)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645233806     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889805033157     Document Type: Review

References (7)

1. Morawiec, A. (1999). J. Appl. Cryst. 32, 788-798.
2. Morawiec, A. & Bouzy, E. (2006). J. Appl. Cryst. 39, 101-103.
3. Rauch, E. F. & Duft, A. (2005). Mater. Sci. Forum, 495-497, 197-202.
4. Rauch, E. F. & Dupuy, L. (2005). Arch. Metall. Mater. 50, 87-99.
5. Rauch, E. F. & Veron, M. (2005). J. Mater. Sci. Eng. Tech. 36, 552-556.
6. Schwarzer, R. A. & Sukkau, J. (1998). Mater. Sci. Forum, 273-275, 215-222.
7. Zacfferer, S. (2000). J. Appl. Cryst. 33 10-25.