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Journal of Applied Physics

Volumn 108, Issue 3, 2010, Pages

Pulse number dependence of laser-induced periodic surface structures for femtosecond laser irradiation of silicon

(2) Bonse, Jörn a Krüger, Jörg a

a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CENTRAL WAVELENGTH; CORRUGATED SURFACES; FEMTOSECOND (FS) LASER; FEMTOSECOND LASER IRRADIATION; FLUENCES; LASER WAVELENGTH; LASER-INDUCED PERIODIC SURFACE STRUCTURES; LINEARLY POLARIZED; MULTIPLE PULSE; PULSE DURATIONS; PULSE NUMBER; SEM; SEM IMAGE; SILICON SURFACES; SINGLE CRYSTALLINE SILICON; SPATIAL FREQUENCY; SURFACE PLASMON POLARITONS; THEORETICAL MODELS; TWO-DIMENSIONAL FOURIER TRANSFORM;

FOURIER TRANSFORMS; IRRADIATION; LASER PULSES; OPTICAL MICROSCOPY; PERIODIC STRUCTURES; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE;

PULSED LASER APPLICATIONS;

EID: 77955905924 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3456501 Document Type: Article

Times cited : (355)

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