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Volumn 518, Issue 17, 2010, Pages 4791-4797

Thin film deposition and characterization of pure and iron-doped electron-beam evaporated tungsten oxide for gas sensors

Author keywords

Atomic force microscopy; Co evaporated thin films; Electron beam evaporation; Optical properties; Surface characterization; Surface morphology; Tungsten oxide; X ray photoelectron spectroscopy

Indexed keywords

AFM; ALUMINA SUBSTRATES; ANNEALED FILMS; BAND GAP ENERGY; CO-EVAPORATED; CRYSTALLINITIES; ELECTRON BEAM EVAPORATION; FE FILMS; GAS SELECTIVITY; GAS SENSING APPLICATIONS; GAS SENSITIVITY; GAS SENSORS; HIGH VACUUM; IRON-DOPED; NANOSTRUCTURED THIN FILM; NOISE SPECTROSCOPY; OPTICAL BAND GAP ENERGY; PURE TUNGSTEN; ROOM TEMPERATURE; SURFACE CHARACTERIZATION; THIN-FILM DEPOSITIONS; TUNGSTEN OXIDE; TUNGSTEN OXIDE FILMS;

EID: 77955661466     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.01.037     Document Type: Article
Times cited : (41)

References (32)
  • 28
    • 77955661017 scopus 로고
    • Plenum Press London J.
    • J. Tauc 1974 Plenum Press London
    • (1974)
    • Tauc, J.1
  • 30
    • 77955660354 scopus 로고    scopus 로고
    • C.G. Granqvist 1995 Elsevier Amsterdam
    • C.G. Granqvist 1995 Elsevier Amsterdam


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.