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Applied Surface Science

Volumn 256, Issue 22, 2010, Pages 6592-6595

Inter-diffusion study in MgO tunneling magneto-resistive (TMR) system by XPS

(2) Yu, G H a Peng, Xilin b

a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING (China)

b NONE (United States)

Author keywords

CoFeB; Inter diffusion; MgO; TMR; XPS

Indexed keywords

BINARY ALLOYS; BORON; COBALT COMPOUNDS; DIFFUSION BARRIERS; MAGNESIA; OXYGEN; PROTECTIVE ATMOSPHERES; TANTALUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

BARRIER LAYERS; BORON SEGREGATION; COFEB; CRYSTALLIZATION PROCESS; ELEVATED TEMPERATURE; LATTICE MATCHING; OXYGEN DIFFUSION; TUNNELING MAGNETO RESISTIVE;

NITROGEN COMPOUNDS;

EID: 77955659949 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2010.04.053 Document Type: Article

Times cited : (12)

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