X-ray omni microscopy

Journal of Microscopy

Volumn 214, Issue 3, 2004, Pages 315-327

  Paganin, D ^a,b   Gureyev, T E ^a   Mayo, S C ^a   Stevenson, A W ^a   Nesterets, Ya I ^a   Wilkins, S W ^a  

^a CSIRO   (Australia)

^b MONASH UNIVERSITY   (Australia)

Author keywords

Holography; Phase contrast; Phase retrieval; Point projection microscopy; X ray microscopy

Indexed keywords

HOLOGRAPHY; LENSES; WAVE FUNCTIONS;

COHERENT IMAGING SYSTEMS; COMPLEX WAVES; PHASE RETRIEVAL; PHASE-CONTRAST; POINT PROJECTION; POINT-PROJECTION MICROSCOPY; PROJECTION MICROSCOPY; SCALAR WAVES; WAVEFIELDS; X RAY MICROSCOPY;

IMAGING SYSTEMS;

CONFERENCE PAPER; IMAGING SYSTEM; MATHEMATICAL MODEL; MATHEMATICAL PARAMETERS; MICROSCOPY; OPTICS; PRIORITY JOURNAL; SPIKE WAVE; X RAY ANALYSIS;

EID: 1842615314     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01315.x     Document Type: Article

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