Yield and deformation in biaxially stressed multilayer metallic thin films

Journal of Engineering Materials and Technology

Volumn 131, Issue 4, 2009, Pages 0412031-0412036

  Overman, N R ^a   Overman, C T ^a   Zbib, H M ^a   Bahr, D F ^a  

^a Washington State University   (United States)

Author keywords

Mechanical behavior; Plastic behavior; Principles of the micro macro transition

Indexed keywords

BINARY ALLOYS; COPPER ALLOYS; DEFORMATION; FILM PREPARATION; MULTILAYERS; NANOINDENTATION; NIOBIUM ALLOYS; OXIDE FILMS; SILICON WAFERS; TERNARY ALLOYS;

MECHANICAL BEHAVIOR; MICRO-MACRO TRANSITION; MULTI-LAYER THIN FILM; NANO-INDENTATION HARDNESS; PLASTIC BEHAVIOR; PRESSURIZED MEMBRANE; RECTANGULAR WINDOWS; UNIFORM DEFORMATION;

MULTILAYER FILMS;

EID: 77955250851     PISSN: 00944289     EISSN: 15288889     Source Type: Journal    
DOI: 10.1115/1.3183775     Document Type: Conference Paper

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