In situ TEM observations of fracture in nanolaminated metallic thin films

International Journal of Fracture

Volumn 120, Issue 1-2, 2003, Pages 351-357

  Foecke, T ^a   Kramer, D E ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

In situ straining; Nanolaminate; TEM

Indexed keywords

CRACK PROPAGATION; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CRACK DEFLECTION;

FRACTURE;

FILM; FRACTURE;

EID: 0141482412     PISSN: 03769429     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1024967510917     Document Type: Article

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