A novel bulge-testing setup for rectangular free-standing thin films

Review of Scientific Instruments

Volumn 70, Issue 10, 1999, Pages 4026-4031

  Kalkman, A J ^a   Verbruggen, A H ^a   Janssen, G C A M ^a   Groen, F H ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001259780     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150029     Document Type: Article

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