Characterization of young's modulus of nanowires on microcantilever beams

Journal of Applied Mechanics, Transactions ASME

Volumn 76, Issue 6, 2009, Pages 1-5

  Lilley, Carmen M ^a   He, Jin ^a  

^a University of Illinois at Chicago   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM STRUCTURES; COMPOSITE BEAM STRUCTURES; COMPOSITE SYSTEMS; ELECTROSTATIC ACTUATION; MECHANICAL BEHAVIOR; MICRO BEAMS; MICRO-CANTILEVERS; MICROCANTILEVER BEAMS; NANOWIRE ARRAYS; NEW APPROACHES; RESONANCE FREQUENCIES; TEST SYSTEMS; YOUNG'S MODULUS;

ATOMIC FORCE MICROSCOPY; COMPOSITE MICROMECHANICS; ELASTIC MODULI; ELECTROSTATIC ACTUATORS; FINITE ELEMENT METHOD; NATURAL FREQUENCIES; PRESTRESSED BEAMS AND GIRDERS;

NANOWIRES;

EID: 77955236244     PISSN: 00218936     EISSN: 15289036     Source Type: Journal    
DOI: 10.1115/1.3130443     Document Type: Article

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