Size effects on the stiffness of silica nanowires

Small

Volumn 2, Issue 2, 2006, Pages 239-243

  Silva, Emílio C C M ^a   Tong, Limin ^b   Yip, Sidney ^a   Van Vliet, Krystyn J ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

Mechanical properties; Molecular dynamics; Nanowires; Scanning probe microscopy; Silicates

Indexed keywords

COMPUTATIONAL METHODS; ELASTICITY; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; STIFFNESS; WIRE;

NANOWIRES; SCANNING PROBE MICROSCOPY; SURFACE-AREA-TO-VOLUME RATIO;

SILICA;

NANOTUBE; SILICON DIOXIDE;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; ELASTICITY; ELECTRICITY; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; ELASTICITY; ELECTRIC WIRING; MATERIALS TESTING; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES; PARTICLE SIZE; SILICON DIOXIDE; STRESS, MECHANICAL; SURFACE PROPERTIES;

EID: 32044438441     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200500311     Document Type: Article

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