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Volumn 12, Issue 4, 2002, Pages 458-464

Pull-in voltage analysis of electrostatically actuated beam structures with fixed-fixed and fixed-free end conditions

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC POTENTIAL; ELECTROSTATICS; FINITE ELEMENT METHOD;

EID: 0036646594     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/12/4/319     Document Type: Article
Times cited : (362)

References (15)
  • 3
    • 0031168990 scopus 로고    scopus 로고
    • MTEST: A test chip for MEMS material property measurement using electrostatically actuated test structures
    • (1997) J. MEMS , vol.6 , pp. 107-118
    • Osterberg, P.M.1    Senturia, S.2
  • 11
    • 0024883915 scopus 로고
    • Measurement of fracture stress, Young's modulus, and intrinsic stress of heavily boron-doped silicon microstructures
    • (1989) Thin Solid Films , vol.181 , pp. 251-258
    • Najafi, K.1    Suzuki, K.2
  • 13
    • 0000053024 scopus 로고
    • The capacitance of a parallel-plate capacitor by the Schwartz-Christoffel transformation
    • March
    • (1937) Elect. Eng. , vol.56 , pp. 363-366
    • Palmer, H.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.